Publication:
Computer controlled automatic test system for testing integrated circuits

dc.contributor.author Walton, Robin Leslie Arthur en_US
dc.date.accessioned 2022-03-16T15:57:36Z
dc.date.available 2022-03-16T15:57:36Z
dc.date.issued 1972 en_US
dc.identifier.uri http://hdl.handle.net/1959.4/56933
dc.language English
dc.language.iso EN en_US
dc.publisher UNSW, Sydney en_US
dc.rights CC BY-NC-ND 3.0 en_US
dc.rights.uri https://creativecommons.org/licenses/by-nc-nd/3.0/au/ en_US
dc.source Thesis Digitisation Program en_US
dc.subject.other Integrated circuits Testing en_US
dc.title Computer controlled automatic test system for testing integrated circuits en_US
dc.type Thesis en_US
dcterms.accessRights open access
dcterms.rightsHolder Walton, Robin Leslie Arthur
dspace.entity.type Publication en_US
unsw.accessRights.uri https://purl.org/coar/access_right/c_abf2
unsw.identifier.doi https://doi.org/10.26190/unsworks/5331
unsw.relation.faculty Engineering
unsw.relation.originalPublicationAffiliation Walton, Robin Leslie Arthur, Electrical Engineering, Faculty of Engineering, UNSW en_US
unsw.relation.school School of Electrical Engineering and Telecommunications *
unsw.thesis.degreetype Masters Thesis en_US
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