Publication:
Electrically detected magnetic resonance using radio-frequency reflectometry

dc.contributor.author Huebl, H. en_US
dc.contributor.author Starrett, R. P. en_US
dc.contributor.author McCamey, D. R. en_US
dc.contributor.author Ferguson, A. J. en_US
dc.contributor.author Willems van Beveren, Laurens Henry en_US
dc.date.accessioned 2021-11-25T14:45:30Z
dc.date.available 2021-11-25T14:45:30Z
dc.date.issued 2009 en_US
dc.description.abstract The authors demonstrate readout of electrically detected magnetic resonance at radio frequencies by means of a LCR tank circuit. Applied to a silicon field-effect transistor at millikelvin temperatures, this method shows a 25-fold increased signal-to-noise ratio of the conduction band electron spin resonance and a higher operational bandwidth of >300 kHz compared to the kilohertz bandwidth of conventional readout techniques. This increase in temporal resolution provides a method for future direct observations of spin dynamics in the electrical device characteristics.. en_US
dc.identifier.issn 0034-6748 en_US
dc.identifier.uri http://hdl.handle.net/1959.4/44473
dc.language English
dc.language.iso EN en_US
dc.rights CC BY-NC-ND 3.0 en_US
dc.rights.uri https://creativecommons.org/licenses/by-nc-nd/3.0/au/ en_US
dc.source Legacy MARC en_US
dc.subject.other radio frequency en_US
dc.subject.other EDMR en_US
dc.subject.other silicon en_US
dc.subject.other LCR circuit en_US
dc.subject.other phosphorus en_US
dc.subject.other stripline en_US
dc.title Electrically detected magnetic resonance using radio-frequency reflectometry en_US
dc.type Journal Article en
dcterms.accessRights open access
dspace.entity.type Publication en_US
unsw.accessRights.uri https://purl.org/coar/access_right/c_abf2
unsw.description.notePublic The following article appeared in Rev. Sci. Instrum. 80, 114705 (2009) and may be found at: http://link.aip.org/link/?RSINAK/80/114705/1 en_US
unsw.description.publisherStatement Copyright 2009 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. en_US
unsw.identifier.doiPublisher http://dx.doi.org/10.1063/1.3258206 en_US
unsw.relation.faculty Science
unsw.relation.ispartofissue 11 en_US
unsw.relation.ispartofjournal Review of Scientific Instruments en_US
unsw.relation.ispartofpagefrompageto 114705-1-114705-4 en_US
unsw.relation.ispartofvolume 80 en_US
unsw.relation.originalPublicationAffiliation Huebl, H. en_US
unsw.relation.originalPublicationAffiliation Starrett, R. P. en_US
unsw.relation.originalPublicationAffiliation McCamey, D. R. en_US
unsw.relation.originalPublicationAffiliation Ferguson, A. J. en_US
unsw.relation.originalPublicationAffiliation Willems van Beveren, Laurens Henry, Physics, Faculty of Science, UNSW en_US
unsw.relation.school School of Physics *
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