Publication:
Amplified Backscattering from a Rough Surface Through Dyedoped Polymer
Amplified Backscattering from a Rough Surface Through Dyedoped Polymer
dc.contributor.author | Peng, Gang-Ding | en_US |
dc.contributor.author | Gu, Zu-Han | en_US |
dc.date.accessioned | 2021-11-25T14:38:51Z | |
dc.date.available | 2021-11-25T14:38:51Z | |
dc.date.issued | 1999 | en_US |
dc.description.abstract | We report the experimental study of the enhanced backscattering from a random rough surface through dye-doped polymer. The sample is a two-dimensional rough gold surface with a large slope coated with Pyrromethene-doped polymer layer. The sample is illuminated with an s-polarized He-Ne laser, which is pumped by a CW Argon Ion laser. The amplified scattering is measured. It is found that the enhanced backscattering peak is sharply increasing and the width is narrowing for a sample with low dielectric constant (epsilon) 2. | en_US |
dc.identifier.isbn | 0819432709 | en_US |
dc.identifier.uri | http://hdl.handle.net/1959.4/43063 | |
dc.language | English | |
dc.language.iso | EN | en_US |
dc.publisher | SPIE - The International Society for Optical Engineering | en_US |
dc.rights | CC BY-NC-ND 3.0 | en_US |
dc.rights.uri | https://creativecommons.org/licenses/by-nc-nd/3.0/au/ | en_US |
dc.source | Legacy MARC | en_US |
dc.title | Amplified Backscattering from a Rough Surface Through Dyedoped Polymer | en_US |
dc.type | Conference Paper | en |
dcterms.accessRights | open access | |
dspace.entity.type | Publication | en_US |
unsw.accessRights.uri | https://purl.org/coar/access_right/c_abf2 | |
unsw.description.notePublic | Peng, G. & Gu, ZM., "Amplified backscattering from a rough surface through dye-doped polymer," Rough Surface Scattering and Contamination, Philip T. C. Chen, Zu-Han Gu, Alexei A. Maradudin (eds), 3784, 274, (1999). | en_US |
unsw.description.publisherStatement | Copyright 1999 Society of Photo-Optical Instrumentation Engineers. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited. | en_US |
unsw.identifier.doiPublisher | http://dx.doi.org/10.1117/12.366710 | en_US |
unsw.publisher.place | USA | en_US |
unsw.relation.faculty | Engineering | |
unsw.relation.ispartofconferenceLocation | Denver, Colorado | en_US |
unsw.relation.ispartofconferenceName | SPIE Rough Surface Scattering and Contamination | en_US |
unsw.relation.ispartofconferenceProceedingsTitle | Proc. Of SPIE, Rough Surface Scattering and Contamination | en_US |
unsw.relation.ispartofconferenceYear | 1999 | en_US |
unsw.relation.ispartofpagefrompageto | 274-284 | en_US |
unsw.relation.originalPublicationAffiliation | Peng, Gang-Ding, Electrical Engineering & Telecommunications, Faculty of Engineering, UNSW | en_US |
unsw.relation.originalPublicationAffiliation | Gu, Zu-Han, Surface Optics Corporation | en_US |
unsw.relation.school | School of Electrical Engineering and Telecommunications | * |
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