Publication:
Amplified Backscattering from a Rough Surface Through Dyedoped Polymer

dc.contributor.author Peng, Gang-Ding en_US
dc.contributor.author Gu, Zu-Han en_US
dc.date.accessioned 2021-11-25T14:38:51Z
dc.date.available 2021-11-25T14:38:51Z
dc.date.issued 1999 en_US
dc.description.abstract We report the experimental study of the enhanced backscattering from a random rough surface through dye-doped polymer. The sample is a two-dimensional rough gold surface with a large slope coated with Pyrromethene-doped polymer layer. The sample is illuminated with an s-polarized He-Ne laser, which is pumped by a CW Argon Ion laser. The amplified scattering is measured. It is found that the enhanced backscattering peak is sharply increasing and the width is narrowing for a sample with low dielectric constant (epsilon) 2. en_US
dc.identifier.isbn 0819432709 en_US
dc.identifier.uri http://hdl.handle.net/1959.4/43063
dc.language English
dc.language.iso EN en_US
dc.publisher SPIE - The International Society for Optical Engineering en_US
dc.rights CC BY-NC-ND 3.0 en_US
dc.rights.uri https://creativecommons.org/licenses/by-nc-nd/3.0/au/ en_US
dc.source Legacy MARC en_US
dc.title Amplified Backscattering from a Rough Surface Through Dyedoped Polymer en_US
dc.type Conference Paper en
dcterms.accessRights open access
dspace.entity.type Publication en_US
unsw.accessRights.uri https://purl.org/coar/access_right/c_abf2
unsw.description.notePublic Peng, G. & Gu, ZM., "Amplified backscattering from a rough surface through dye-doped polymer," Rough Surface Scattering and Contamination, Philip T. C. Chen, Zu-Han Gu, Alexei A. Maradudin (eds), 3784, 274, (1999). en_US
unsw.description.publisherStatement Copyright 1999 Society of Photo-Optical Instrumentation Engineers. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited. en_US
unsw.identifier.doiPublisher http://dx.doi.org/10.1117/12.366710 en_US
unsw.publisher.place USA en_US
unsw.relation.faculty Engineering
unsw.relation.ispartofconferenceLocation Denver, Colorado en_US
unsw.relation.ispartofconferenceName SPIE Rough Surface Scattering and Contamination en_US
unsw.relation.ispartofconferenceProceedingsTitle Proc. Of SPIE, Rough Surface Scattering and Contamination en_US
unsw.relation.ispartofconferenceYear 1999 en_US
unsw.relation.ispartofpagefrompageto 274-284 en_US
unsw.relation.originalPublicationAffiliation Peng, Gang-Ding, Electrical Engineering & Telecommunications, Faculty of Engineering, UNSW en_US
unsw.relation.originalPublicationAffiliation Gu, Zu-Han, Surface Optics Corporation en_US
unsw.relation.school School of Electrical Engineering and Telecommunications *
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