Recent advances in FIB-based site-specific atom probe specimen preparation techniques

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Abstract
The Focused ion beam is being developed as a routine tool for the site specific preparation of specimen for Atom Probe Tomography. This paper presents recent advances in this technique demonstrated with results obtained from a bulk metallic glass specimen.
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http://hdl.handle.net/1959.4/44668
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http://dx.doi.org/10.1017/S1431927607071437
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Author(s)
Cairney, Julie
McKenzie, Warren
Saxey, David
Munroe, Paul
Ringer, Simon
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Publication Year
2007
Resource Type
Conference Paper
Degree Type
UNSW Faculty
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download M&M '07 paper.pdf 3.53 MB Adobe Portable Document Format
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