Charge Collection and Radiation Hardness of a SOI Microdosimeter for Medical and Space Applications

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Abstract
The first results obtained using a SOI device for microdosimetry applications are presented. Microbeam and broadbeam spectroscopy methods are used for determining minority carrier lifetime and radiation damage constants. A spectroscopy model is presented which includes the majority of effects that impact spectral resolution. Charge collection statistics were found to substantially affect spectral resolution. Lateral diffusion effects significantly complicate charge collection
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Author(s)
Bradley, Peter
Rozenfeld, Anatoly
Lee, Kevin
Jamieson, Dana
Heiser, Gernot
Satoh, S
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Publication Year
1998
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Journal Article
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