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  • (2001) Corkish, Richard; Altermatt, Pietro P.; Heiser, Gernot
    Journal Article
    Three-dimensional numerical simulations of electron-beam-induced current (EBIC) near a vertical silicon grain boundary are demonstrated. They are compared with an analytical model which excludes the effect of carrier generation other than in the bulk base region of a solar cell structure. We demonstrate that in a wide range of solar cell structures recombination in the space charge region (SCR) significantly affects the EBIC results and hence needs to be included in the data evaluation. Apart from these findings, simulations of a realistic silicon solar cell structure (thick emitter, field-dependent mobility, etc.) are demonstrated.

  • (2000) Cotera, Angela; Simpson, John; Erickson, E; Colgan, Sean; Burton, Michael; Allen, David
    Journal Article

  • (2007) Zhu, Liming; Ali Babar, Muhammad; Staples, Mark; Nonaka, Makoto
    Book Chapter
    The possible variability of project delay is useful information to understand and mitigate the project delay risk. However, it is not sufficiently considered in the literature concerning effort estimation and simulation in software product line development. In this paper, we propose a project delay simulation model by introducing a random variable to represent the variability of adaptive rework. The model has been validated through stochastic simulations by comparing generated adaptive rework to an actual change effort distribution, and by sensitivity analysis. The result shows that the proposed model is capable of producing reasonable variability of adaptive rework, and consequently, variability of project delay. Analysis of our model indicates that the strength of dependency has a larger impact than the number of residual defects, for the studied simulation settings. However, high levels of adaptive rework variability did not have great impact on overall project delay.