Engineering

Publication Search Results

Now showing 1 - 2 of 2
  • (1998) Bradley, Peter; Rozenfeld, Anatoly; Lee, Kevin; Jamieson, Dana; Heiser, Gernot; Satoh, S
    Journal Article
    The first results obtained using a SOI device for microdosimetry applications are presented. Microbeam and broadbeam spectroscopy methods are used for determining minority carrier lifetime and radiation damage constants. A spectroscopy model is presented which includes the majority of effects that impact spectral resolution. Charge collection statistics were found to substantially affect spectral resolution. Lateral diffusion effects significantly complicate charge collection

  • (1999) Hughes, Margaret; Turner, Ian
    Book Chapter