Data for "Thermal Processes and their Impact on Surface Related Degradation" 2021-11-26T10:08:41Z 2021-11-26T10:08:41Z 2021 en_US
dc.description.abstract Photoconductance carrier lifetime measurements for the paper "Thermal Processes and their Impact on Surface Related Degradation" published in physica status solidi - rapid research letters en_US
dc.language English
dc.language.iso EN en_US
dc.rights CC-BY
dc.rights.uri en_US
dc.subject.other Silicon en_US
dc.subject.other Photovoltaics en_US
dc.subject.other Degradation en_US
dc.subject.other Surface Passivation en_US
dc.subject.other Defect Engineering en_US
dc.title Data for "Thermal Processes and their Impact on Surface Related Degradation" en_US
dc.type Dataset en_US
dcterms.accessRights open access
dcterms.accrualMethod 156×156 mm 1.6 cm boron doped p-type Czochralski silicon wafers were used. The wafers were textured in a KOH/IPA solution to remove saw damage and texture both surfaces. They were then given an RCA2 clean followed by a HF dip to remove any native oxide before dielectric deposition.All dielectric depositions were carried out in a Meyer Burger MAiA remote PECVD tool. Half of the wafers (Groups 1,2,5) were coated with SiNX:H at a set point of 400oC, with a target thickness of 75 nm and refactive index (RI) of 2.08. The other wafers (Groups 3,4,6) were coated with an AlOX:H/SiNX:H stack. The AlOX:H layer was deposited at a set point of 400oC with a target thickness of 24 nm and RI of 1.588, while the SiNX:H layer was deposited at a set point of 350oC with a target thickness of 80 nm and RI of 2.08. The dielectric deposition parameters match those used in a previous study, which demonstrated no significant SRD without firing.[18]All wafers were fired in a Meyer Burger Camini belt firing furnace with a peak firing set temperature of 855oC. The dielectric layers of wafers from Groups 2,3,5 and 6 were then stripped in a HF solution. Groups 2 and 3 were then re-coated with a SiNX:H layer, while groups 5 and 6 had a fresh AlOX:H/SiNX:H stack deposited. In both cases deposition parameters were identical to those used initially.Wafers were then laser cleaved into 52×52 mm lifetime samples for annealing and light soaking. A hotplate was used to anneal samples from each group at temperatures of 300, 350 and 400oC for 5 or 30 minutes in the dark. Annealed and non-annealed samples were then light soaked in a GSola GCD-4 LID Test chamber at 150oC under 1 sun equivalent illumination.The injection dependent effective carrier lifetime was measured ex-situ throughout light soaking using a Sinton Instruments WCT-120 lifetime tester. MThe measurements were taken with the 1/1 flash and analysed using the generalized method.[25] In order to allow a reasonable comparison between structures with differing initial lifetimes the concept of lifetime equivalent defect density (∆N_leq), also known as normalized defect density,[26] is used:∆N_leq=1/τ_eff -1/τ_(eff.initial)In this work τ_(eff.initial) is taken to be the highest effective lifetime measured either before or during light soaking. In the case of samples passivated with SiNX:H this occurred within the first 2 hours of light soaking, whereas for samples passivated with AlOX:H/SiNX:H stacks the situation was more complicated. Because SRD has the greatest effect on effective lifetime at high injection levels, and to avoid trapping effects, ∆N_leq was calculated at a minority carrier density (MCD) of 1×1016 cm-3 in this work. en_US
dcterms.rightsHolder Copyright 2021, University of New South Wales en_US
dspace.entity.type Dataset en_US
unsw.contributor.researchDataCreator Hamer, Phillip en_US
unsw.contributor.researchDataCreator Chen, Daniel en_US
unsw.contributor.researchDataCreator Bonilla, Ruy S. en_US
unsw.description.storageplace School of Photovoltaic and Renewable Energy Engineering, Faculty of Engineering, UNSW en_US
unsw.identifier.doi en_US
unsw.isPublicationRelatedToDataset Computational study of perovskite redox materials for solar thermal ammonia synthesis
unsw.relation.OriginalPublicationAffiliation Hamer, Phillip, PV & Renewable Energy Eng, Engineering, en_US
unsw.relation.OriginalPublicationAffiliation Chen, Daniel, , Sundrive Australia, en_US
unsw.relation.OriginalPublicationAffiliation Bonilla, Ruy S., , Department of Materials, University of Oxford, en_US
unsw.relation.faculty Engineering School of Photovoltaic and Renewable Energy Engineering
unsw.subject.fieldofresearchcode 090605 Photodetectors, Optical Sensors and Solar Cells en_US
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Explanatory Note.docx
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