Data for "Thermal Processes and their Impact on Surface Related Degradation"

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open access
Copyright: Copyright 2021, University of New South Wales
Abstract
Photoconductance carrier lifetime measurements for the paper "Thermal Processes and their Impact on Surface Related Degradation" published in physica status solidi - rapid research letters
Link to External Data Repository
Electronic Location
Contact Information
Research Data Creator(s)
Chen, Daniel
Bonilla, Ruy S.
Lead Chief Investigator
Other Contributor(s)
Corporate/Industry Contributor(s)
Publication Year
2021
Resource Type
Dataset
Keyword(s)
Silicon
Photovoltaics
Degradation
Surface Passivation
Defect Engineering
UNSW Faculty
Files
download Explanatory Note.docx 12.68 KB Microsoft Word XML
download Summary.xlsx 527.47 KB Microsoft Excel XML
download Lifetime Files.rar 281.55 MB WinRAR Compressed Archive
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